Handbook Of Microscopy For Nanotechnology

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Format: Hardcover
Pub. Date: 2005-03-01
Publisher(s): Kluwer Academic Pub
List Price: $299.99

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Summary

Nanotechnology is a field that has and will have substantial intrinsic merit to new technology advancement and to the world economy and quality of life. Nanostructure is concerned with materials and systems whose structures and components exhibit novel physical, chemical and biological properties due to their small size. The aim is to exploit these properties by gaining control of structures and devices at atomic, molecular, and supra-molecular levels and to learn to efficiently manufacture and use these devices. The potential of this technology is almost beyond comprehension and may include applications such as systems that conduct electricity without loss, materials with orders of magnitude more strength than steel at only a small fraction of the weight, devices that store information comparable in size to the information contained in the Library of Congress so small as to fit into in a shirt pocket, and effective treatments and cures for many diseases. Microscopy

Table of Contents

Preface xv
List of Contributors xvii
I. OPTICAL MICROSCOPY, SCANNING PROBE MICROSCOPY, ION MICROSCOPY, AND NANOFABRICATION 1(322)
1. Confocal Scanning Optical Microscopy and Nanotechnology
3(22)
Peter J. Lu
1. Introduction
5
2. The Confocal Microscope
3(12)
3. Applications to Nanotechnology
15(5)
4. Summary and Future Perspectives
20(1)
Acknowledgements
21(1)
References
21(4)
2. Scanning Near Field Optical Microscopy in Nanosciences
25(30)
Alexandre Bouhelier, Achim Hartschuh, and Lukas Novotny
1. Scanning Near-Field Optical Microscopy and Nanotechnology
25(1)
2. Basic Concepts
26(1)
3. Instrumentation
27(7)
4. Applications in Nanoscience
34(16)
5. Perspectives
50(1)
References
51(4)
3. Scanning Tunneling Microscopy
55(58)
Jin-Feng Jia, Wei-Sheng Yang, and Qi-Kun Xue
1. Basic Principles of Scanning Tunneling Microscopy
55(4)
2. Surface Structure Determination by Scanning Tunneling Microscopy
59(22)
3. Scanning Tunneling spectroscopies
81(11)
4. STM-based Atomic Manipulation
92(6)
5. Recent Developments
98(11)
References
109(4)
4. Visualization of Nanostructures with Atomic Force Microscopy
113(44)
Sergei N. Magonov and Natalya A. Yerina
Introductory Remarks
113(2)
Basics of Atomic Force Microscopy
115(19)
Imaging of Macromolecules and their Self-Assemblies
134(12)
Studies of Heterogeneous Systems
146(7)
Concluding Remarks
153(1)
References
154(3)
5. Scanning Probe Microscopy for Nanoscale Manipulation and Patterning
157(26)
Seunghun Hong, Jiwoon Im, Minbaek Lee and Narae Cho
1. Introduction
157(5)
2. Nanoscale Pen Writing
162(5)
3. Nanoscale Scratching
167(4)
4. Nanoscale Manipulation
171(3)
5. Nanoscale Chemistry
174(4)
6. Nanoscale Light Exposure
178(1)
7. Future Perspectives
179(1)
References
180(3)
6. Scanning Thermal and Thermoelectric Microscopy
183(24)
Li Shi
1. Introduction
183(1)
2. Instrumentation of Scanning Thermal and Thermoelectric Microscopy
184(7)
3. Theory of Scanning Thermal and Thermoelectric Microscopy
191(6)
4. Applications of Scanning Thermal and Thermoelectric Microscopy in Nanotechnology
197(6)
5. Summary and Future Aspects
203(1)
Acknowledgements
204(1)
References
204(3)
7. Imaging Secondary Ion Mass Spectrometry
207(20)
William A. Lamberti
1. Secondary Ion Mass Spectrometry and Nanotechnology
207(1)
2. Introduction to Secondary Ion Mass Spectrometry
208(5)
3. Experimental Issues in Imaging SIMS
213(3)
4. Applications in Nanotechnology
216(4)
5. Summary and Future Perspectives
220(2)
References
222(5)
8. Atom Probe Tomography
227(20)
M.K. Miller
1. Atom Probe Tomography and Nanotechnology
227(1)
2. Instrumentation of Atom Probe Tomography
228(9)
3. Basic Information
237(1)
4. Data Interpretation and Visualization
238(6)
5. Sample Analysis of Nanomaterials: Multilayer Films
244(1)
6. Summary and Future Perspectives
245(1)
Acknowledgements
245(1)
References
246(1)
9. Focused Ion Beam Systems-A Multifunctional Tool for Nanotechnology
247(40)
Nan Yao
1. Introduction
247(3)
2. Principles and Practice of the Focused Ion Beam System
250(16)
3. Application of Focused Ion Beam Instrumentation
266(18)
Acknowledgements
284(1)
References
284(3)
10. Electron Beam Lithography
287(36)
Zhiping (James) Zhou
1. Electron Beam Lithography and Nanotechnology
287(2)
2. Instrumentation of Electron Beam Lithography
289(11)
3. Electron-Solid Interactions
300(6)
4. Pattern Transfer Process
306(4)
5. Applications in Nanotechnology
310(8)
6. Summary and Future Perspectives
318(1)
References
319(4)
II. ELECTRON MICROSCOPY 323(394)
11. High Resolution Scanning Electron Microscopy
325(36)
Jingyue Liu
1. Introduction: Scanning Electron Microscopy and Nanotechnology
325(4)
2. Electron-Specimen Interactions
329(5)
3. Instrumentation of the Scanning Electron Microscope
334(8)
4. The Resolution of Secondary and Backscattered Electron Images
342(3)
5. Contrast Mechanisms of SE and BE Images of Nanoparticles and Other Systems
345(7)
6. Applications to Characterizing Nanophase Materials
352(3)
7. Summary and Perspectives
355(3)
References
358(3)
12. High-Spatial Resolution Quantitative Electron Beam Microanalysis for Nanoscale Materials
361 (40)
Dale E. Newbury, John Henry J. Scott, Scott Wight, and John A. Small
1. Introduction
361(1)
2. The Nanomaterials Characterization Challenge: Bulk Nanostructures and Discrete Nanoparticles
362(2)
3. Physical Basis of the Electron-Excited Analytical Spectrometries
364(2)
4. Nanoscale Elemental Characterization with High Electron Beam Energy
366(4)
5. EELS Quantification
370(1)
6. Spatial Sampling of the Target with EELS
371(8)
7. Nanoscale Elemental Characterization with Low and Intermediate Electron Beam Energy
379(11)
8. Examples of Applications to Nanoscale Materials
390(9)
9. Conclusions
399(1)
References
399(2)
13. Characterization of Nano-Crystalline Materials using Electron Backscatter Diffraction in the Scanning Electron Microscope
401(26)
J.R. Michael
1. Introduction
401(1)
2. Historical Development of EBSD
402(1)
3. Origin of EBSD Patterns
403(5)
4. Resolution of EBSD
408(5)
5. Sample Preparation of Nano-materials for EBSD
413(2)
6. Applications of EBSD to Nano-materials
415(9)
7. Summary
424(1)
Acknowledgements
424(1)
References
424(3)
14. High-Resolution Transmission Electron Microscopy
427(28)
David J. Smith
1. HRTEM and Nanotechnology
427(1)
2. Principles and Practice of HRTEM
428(6)
3. Applications of HRTEM
434(9)
4. Current Trends
443(5)
5. Ongoing Problems
448(1)
6. Summary and Future Perspective
449(1)
References
450(5)
15. Scanning Transmission Electron Microscopy
455(38)
J.M. Cowley
1. Introduction
455(4)
2. STEM Imaging
459(6)
3. STEM Imaging of Crystals
465(4)
4. Diffraction in STEM Instruments
469(4)
5. Microanalysis in STEM
473(1)
6. Studies of Nanoparticles and Nanotubes
474(1)
7. Studies of Crystal Defects and Interfaces
475(2)
8. The Structure and Composition of Surfaces
477(3)
9. Amorphous Materials
480(2)
10. STEM Holography
482(2)
11. Ultra-High-Resolution STEM
484(3)
12. Conclusions
487(1)
Acknowledgements
488(1)
References
488(5)
16. In-Situ Electron Microscopy for Nanomeasurements
493 (38)
Zhong Lin Wang
1. Introduction
493(2)
2. Thermal Induced Surface Dynamic Processes of Nanocrystals
495(1)
3. Measuring Dynamic Bending Modulus By Electric Field Induced Mechanical Resonance
496(10)
4. Young's Modulus of Composite Nanowires
506(2)
5. Bending Modulus of Oxide Nanobelts
508(4)
6. Nanobelts as Nanocantilevers
512(1)
7. In-situ Field Emission from Nanotube
513(1)
8. Work Function at the Tips of Nanotubes and Nanobelts
513(4)
9. Mapping the Electrostatic Potential at the Nanotube Tips
517(1)
10. Field Emission Induced Structural Damage
518(3)
11. Nanothermometer and Nanobearing
521(1)
12. In-situ Transport Measurement of Nanotubes
521(7)
13. Summary
528(1)
Acknowledgement
528(1)
References
529(2)
17. Environmental Transmission Electron Microscopy in Nanotechnology
531 (36)
Renu Sharma and Peter A. Crozier
1. Introduction
531(1)
2. History of ETEM
532(6)
3. Data Collection
538(3)
4. Experimental Design Strategies
541(2)
5. Applications to Nanomaterials
543(19)
6. Conclusions
562(1)
References
563(4)
18. Electron Nanocrystallography
567 (34)
Jian-Min Zuo
1. Introduction
567(1)
2. Electron Diffraction Modes and Geometry
568(4)
3. Theory of Electron Diffraction
572(12)
4. Experimental Analysis
584(6)
5. Applications to Nanostructure Characterization
590(8)
6. Conclusions and Future Perspectives
598(1)
References
598(3)
19. Tomography using Transmission Electron Microscope
601 (28)
P.A. Midgley
1. Introduction
601(2)
2. Tomography
603(6)
3. Tomography in the Electron Microscope
609(6)
4. STEM HAADF (Z-Contrast) Tomography
615(6)
5. EFTEM Tomography
621(2)
6. Conclusions
623(1)
Acknowledgements
624(1)
References
624(5)
20. Off-Axis Electron Holography
629 (24)
Martha R. McCartney, Rafal E. Dunin-Borkowski and David J. Smith
1. Electron Holography and Nanotechnology
629(1)
2. Description of Off-Axis Electron Holography
630(8)
3. Nanoscale Electrostatic Fields
638(5)
4. Nanoscale Magnetic Fields
643(5)
5. Future Perspectives
648(1)
References
649(4)
21. Sub-nm Spatially Resolved EELS (Electron Energy-Loss Spectroscopy): Methods, Theory and Applications
653 (30)
Christian Colliex and Odile Stéphan
1. Introduction: EELS and Nanotechnology
653(2)
2. Understanding the Information Contained in an EELS Spectrum
655(8)
3. Spatially Resolved EELS
663(6)
4. Elemental Mapping of Individual Nanoparticles using Core-Loss Signals
669(5)
5. Mapping Bonding States and Electronic Structures with ELNES Features
674(4)
6. Conclusion
678(1)
References
679(4)
22. Imaging Magnetic Structures using Transmission Electron Microscopy Methods
683(34)
Takayoshi Tanji
1. Introduction
683(1)
2. Lorentz Microscopy
684(13)
3. Electron Holography
697(16)
4. Summary
713(1)
References
714(3)
Index 717

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