Preface |
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xv | |
List of Contributors |
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xvii | |
I. OPTICAL MICROSCOPY, SCANNING PROBE MICROSCOPY, ION MICROSCOPY, AND NANOFABRICATION |
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1 | (322) |
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1. Confocal Scanning Optical Microscopy and Nanotechnology |
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3 | (22) |
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5 | |
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2. The Confocal Microscope |
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3 | (12) |
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3. Applications to Nanotechnology |
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15 | (5) |
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4. Summary and Future Perspectives |
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20 | (1) |
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21 | (1) |
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21 | (4) |
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2. Scanning Near Field Optical Microscopy in Nanosciences |
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25 | (30) |
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Alexandre Bouhelier, Achim Hartschuh, and Lukas Novotny |
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1. Scanning Near-Field Optical Microscopy and Nanotechnology |
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25 | (1) |
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26 | (1) |
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27 | (7) |
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4. Applications in Nanoscience |
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34 | (16) |
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50 | (1) |
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51 | (4) |
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3. Scanning Tunneling Microscopy |
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55 | (58) |
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Jin-Feng Jia, Wei-Sheng Yang, and Qi-Kun Xue |
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1. Basic Principles of Scanning Tunneling Microscopy |
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55 | (4) |
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2. Surface Structure Determination by Scanning Tunneling Microscopy |
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59 | (22) |
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3. Scanning Tunneling spectroscopies |
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81 | (11) |
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4. STM-based Atomic Manipulation |
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92 | (6) |
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98 | (11) |
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109 | (4) |
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4. Visualization of Nanostructures with Atomic Force Microscopy |
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113 | (44) |
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Sergei N. Magonov and Natalya A. Yerina |
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113 | (2) |
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Basics of Atomic Force Microscopy |
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115 | (19) |
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Imaging of Macromolecules and their Self-Assemblies |
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134 | (12) |
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Studies of Heterogeneous Systems |
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146 | (7) |
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153 | (1) |
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154 | (3) |
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5. Scanning Probe Microscopy for Nanoscale Manipulation and Patterning |
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157 | (26) |
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Seunghun Hong, Jiwoon Im, Minbaek Lee and Narae Cho |
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157 | (5) |
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162 | (5) |
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167 | (4) |
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4. Nanoscale Manipulation |
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171 | (3) |
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174 | (4) |
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6. Nanoscale Light Exposure |
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178 | (1) |
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179 | (1) |
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180 | (3) |
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6. Scanning Thermal and Thermoelectric Microscopy |
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183 | (24) |
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183 | (1) |
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2. Instrumentation of Scanning Thermal and Thermoelectric Microscopy |
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184 | (7) |
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3. Theory of Scanning Thermal and Thermoelectric Microscopy |
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191 | (6) |
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4. Applications of Scanning Thermal and Thermoelectric Microscopy in Nanotechnology |
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197 | (6) |
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5. Summary and Future Aspects |
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203 | (1) |
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204 | (1) |
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204 | (3) |
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7. Imaging Secondary Ion Mass Spectrometry |
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207 | (20) |
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1. Secondary Ion Mass Spectrometry and Nanotechnology |
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207 | (1) |
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2. Introduction to Secondary Ion Mass Spectrometry |
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208 | (5) |
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3. Experimental Issues in Imaging SIMS |
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213 | (3) |
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4. Applications in Nanotechnology |
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216 | (4) |
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5. Summary and Future Perspectives |
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220 | (2) |
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222 | (5) |
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227 | (20) |
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1. Atom Probe Tomography and Nanotechnology |
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227 | (1) |
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2. Instrumentation of Atom Probe Tomography |
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228 | (9) |
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237 | (1) |
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4. Data Interpretation and Visualization |
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238 | (6) |
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5. Sample Analysis of Nanomaterials: Multilayer Films |
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244 | (1) |
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6. Summary and Future Perspectives |
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245 | (1) |
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245 | (1) |
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246 | (1) |
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9. Focused Ion Beam Systems-A Multifunctional Tool for Nanotechnology |
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247 | (40) |
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247 | (3) |
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2. Principles and Practice of the Focused Ion Beam System |
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250 | (16) |
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3. Application of Focused Ion Beam Instrumentation |
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266 | (18) |
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284 | (1) |
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284 | (3) |
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10. Electron Beam Lithography |
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287 | (36) |
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1. Electron Beam Lithography and Nanotechnology |
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287 | (2) |
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2. Instrumentation of Electron Beam Lithography |
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289 | (11) |
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3. Electron-Solid Interactions |
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300 | (6) |
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4. Pattern Transfer Process |
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306 | (4) |
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5. Applications in Nanotechnology |
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310 | (8) |
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6. Summary and Future Perspectives |
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318 | (1) |
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319 | (4) |
II. ELECTRON MICROSCOPY |
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323 | (394) |
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11. High Resolution Scanning Electron Microscopy |
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325 | (36) |
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1. Introduction: Scanning Electron Microscopy and Nanotechnology |
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325 | (4) |
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2. Electron-Specimen Interactions |
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329 | (5) |
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3. Instrumentation of the Scanning Electron Microscope |
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334 | (8) |
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4. The Resolution of Secondary and Backscattered Electron Images |
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342 | (3) |
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5. Contrast Mechanisms of SE and BE Images of Nanoparticles and Other Systems |
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345 | (7) |
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6. Applications to Characterizing Nanophase Materials |
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352 | (3) |
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7. Summary and Perspectives |
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355 | (3) |
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358 | (3) |
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12. High-Spatial Resolution Quantitative Electron Beam Microanalysis for Nanoscale Materials |
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361 | (40) |
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Dale E. Newbury, John Henry J. Scott, Scott Wight, and John A. Small |
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361 | (1) |
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2. The Nanomaterials Characterization Challenge: Bulk Nanostructures and Discrete Nanoparticles |
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362 | (2) |
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3. Physical Basis of the Electron-Excited Analytical Spectrometries |
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364 | (2) |
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4. Nanoscale Elemental Characterization with High Electron Beam Energy |
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366 | (4) |
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370 | (1) |
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6. Spatial Sampling of the Target with EELS |
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371 | (8) |
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7. Nanoscale Elemental Characterization with Low and Intermediate Electron Beam Energy |
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379 | (11) |
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8. Examples of Applications to Nanoscale Materials |
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390 | (9) |
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399 | (1) |
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399 | (2) |
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13. Characterization of Nano-Crystalline Materials using Electron Backscatter Diffraction in the Scanning Electron Microscope |
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401 | (26) |
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401 | (1) |
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2. Historical Development of EBSD |
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402 | (1) |
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3. Origin of EBSD Patterns |
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403 | (5) |
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408 | (5) |
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5. Sample Preparation of Nano-materials for EBSD |
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413 | (2) |
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6. Applications of EBSD to Nano-materials |
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415 | (9) |
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424 | (1) |
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424 | (1) |
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424 | (3) |
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14. High-Resolution Transmission Electron Microscopy |
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427 | (28) |
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1. HRTEM and Nanotechnology |
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427 | (1) |
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2. Principles and Practice of HRTEM |
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428 | (6) |
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434 | (9) |
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443 | (5) |
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448 | (1) |
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6. Summary and Future Perspective |
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449 | (1) |
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450 | (5) |
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15. Scanning Transmission Electron Microscopy |
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455 | (38) |
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455 | (4) |
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459 | (6) |
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3. STEM Imaging of Crystals |
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465 | (4) |
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4. Diffraction in STEM Instruments |
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469 | (4) |
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473 | (1) |
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6. Studies of Nanoparticles and Nanotubes |
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474 | (1) |
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7. Studies of Crystal Defects and Interfaces |
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475 | (2) |
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8. The Structure and Composition of Surfaces |
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477 | (3) |
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480 | (2) |
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482 | (2) |
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11. Ultra-High-Resolution STEM |
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484 | (3) |
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487 | (1) |
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488 | (1) |
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488 | (5) |
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16. In-Situ Electron Microscopy for Nanomeasurements |
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493 | (38) |
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493 | (2) |
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2. Thermal Induced Surface Dynamic Processes of Nanocrystals |
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495 | (1) |
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3. Measuring Dynamic Bending Modulus By Electric Field Induced Mechanical Resonance |
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496 | (10) |
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4. Young's Modulus of Composite Nanowires |
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506 | (2) |
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5. Bending Modulus of Oxide Nanobelts |
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508 | (4) |
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6. Nanobelts as Nanocantilevers |
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512 | (1) |
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7. In-situ Field Emission from Nanotube |
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513 | (1) |
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8. Work Function at the Tips of Nanotubes and Nanobelts |
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513 | (4) |
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9. Mapping the Electrostatic Potential at the Nanotube Tips |
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517 | (1) |
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10. Field Emission Induced Structural Damage |
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518 | (3) |
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11. Nanothermometer and Nanobearing |
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521 | (1) |
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12. In-situ Transport Measurement of Nanotubes |
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521 | (7) |
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528 | (1) |
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528 | (1) |
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529 | (2) |
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17. Environmental Transmission Electron Microscopy in Nanotechnology |
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531 | (36) |
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Renu Sharma and Peter A. Crozier |
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531 | (1) |
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532 | (6) |
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538 | (3) |
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4. Experimental Design Strategies |
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541 | (2) |
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5. Applications to Nanomaterials |
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543 | (19) |
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562 | (1) |
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563 | (4) |
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18. Electron Nanocrystallography |
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567 | (34) |
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567 | (1) |
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2. Electron Diffraction Modes and Geometry |
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568 | (4) |
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3. Theory of Electron Diffraction |
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572 | (12) |
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584 | (6) |
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5. Applications to Nanostructure Characterization |
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590 | (8) |
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6. Conclusions and Future Perspectives |
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598 | (1) |
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598 | (3) |
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19. Tomography using Transmission Electron Microscope |
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601 | (28) |
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601 | (2) |
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603 | (6) |
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3. Tomography in the Electron Microscope |
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609 | (6) |
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4. STEM HAADF (Z-Contrast) Tomography |
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615 | (6) |
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621 | (2) |
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623 | (1) |
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624 | (1) |
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624 | (5) |
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20. Off-Axis Electron Holography |
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629 | (24) |
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Martha R. McCartney, Rafal E. Dunin-Borkowski and David J. Smith |
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1. Electron Holography and Nanotechnology |
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629 | (1) |
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2. Description of Off-Axis Electron Holography |
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630 | (8) |
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3. Nanoscale Electrostatic Fields |
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638 | (5) |
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4. Nanoscale Magnetic Fields |
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643 | (5) |
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648 | (1) |
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649 | (4) |
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21. Sub-nm Spatially Resolved EELS (Electron Energy-Loss Spectroscopy): Methods, Theory and Applications |
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653 | (30) |
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Christian Colliex and Odile Stéphan |
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1. Introduction: EELS and Nanotechnology |
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653 | (2) |
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2. Understanding the Information Contained in an EELS Spectrum |
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655 | (8) |
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3. Spatially Resolved EELS |
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663 | (6) |
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4. Elemental Mapping of Individual Nanoparticles using Core-Loss Signals |
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669 | (5) |
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5. Mapping Bonding States and Electronic Structures with ELNES Features |
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674 | (4) |
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678 | (1) |
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679 | (4) |
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22. Imaging Magnetic Structures using Transmission Electron Microscopy Methods |
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683 | (34) |
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683 | (1) |
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684 | (13) |
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697 | (16) |
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713 | (1) |
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714 | (3) |
Index |
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717 | |