Microstructural Characterization of Materials, 2nd Edition
by David Brandon (Technion - Israel Institute of Technology); Wayne D. Kaplan (Technion - Israel Institute of Technology)Edition: 2nd
Format: Hardcover
Pub. Date: 2008-07-01
Publisher(s): WILEY
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Summary
Microstructural Characterization of Materials, Second Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. In this integrated treatment of the science of microstructural characterization, the three main aspects of microstructural morphology, phase identification, crystallography, and microanalysis of the chemical composition, are all covered in detail. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques, are treated in full.
Table of Contents
| The Concept of Microstructure | |
| Microstructural Features | |
| Crystallography & Crystal Structure | |
| Summary | |
| Bibliography | |
| Worked Examples | |
| Problems | |
| Diffraction Analysis of Crystal Structure | |
| Scattering Of Radiation By Crystals | |
| Reciprocal Space | |
| X-Ray Diffraction Methods | |
| Diffraction Analysis | |
| Electron Diffraction | |
| Summary | |
| Bibliography | |
| Worked Examples | |
| Problems | |
| Optical Microscopy | |
| Geometrical Optics | |
| Construction Of The Microscope | |
| Specimen Preparation | |
| Image Contrast | |
| Working With Digital Images | |
| Resolution, contrast & image interpretation | |
| Summary | |
| Bibliography | |
| Worked Examples | |
| Problems | |
| Transmission Electron Microscopy | |
| Basic Principles | |
| Specimen Preparation | |
| The Origin of Contrast | |
| Kinematic Interpretation of Diffraction Contrast | |
| Dynamic Diffraction & Absorption Effects | |
| Lattice Imaging at High Resolution | |
| Scanning Transmission Electron Microscopy | |
| Summary | |
| Bibliography | |
| Worked Examples | |
| Problems | |
| Scanning Electron Microscopy | |
| Components of The Scanning Electron Microscope | |
| Electron Beam - Specimen Interactions | |
| Electron Excitation of X-Rays | |
| Back-Scattered Electrons | |
| Secondary Electron Emission | |
| Alternative Imaging Modes | |
| Specimen Preparation & Topology | |
| Focused Ion Beam Microscopy | |
| Summary | |
| Bibliography | |
| Worked Examples | |
| Problems | |
| Microanalysis in Electron Microscopy | |
| X-Ray Microanalysis | |
| Electron Energy-Loss Spectroscopy | |
| Summary | |
| Bibliography | |
| Worked Examples | |
| Problems | |
| Scanning Probe Microscopy & Related Techniques | |
| Surface Forces & Surface Morphology | |
| Scanning Probe Microscopes | |
| Field-ion Microscopy & Atom-Probe Tomography | |
| Summary | |
| Bibliography | |
| Problems | |
| Chemical Analysis of Surface Composition | |
| X-Ray Photoelectron Spectroscopy | |
| Auger Electron Spectroscopy | |
| Secondary-Ion Mass Spectrometry | |
| Summary | |
| Bibliography | |
| Worked Examples | |
| Problems | |
| Quantitative & Tomographic Analysis of Microstructure | |
| Basic Stereological Concepts | |
| Accessible & Inaccessible Parameters | |
| Optimizing Accuracy | |
| Automated Image Analysis | |
| Tomography & 3-D Reconstruction | |
| Summary | |
| Bibliography | |
| Worked Examples | |
| Problems | |
| Appendices | |
| Index | |
| Table of Contents provided by Publisher. All Rights Reserved. |
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